Release of SimuLase 3.0

Nonlinear Control Strategies, Inc. announces the release of a version 3.0 of its SimuLase product

SimuLase™ is the first software tool that allows a broad audience to take full advantage of the latest advances in semiconductor theory that have revolutionized device modeling over the past decade. It is the world’s first and only software that fully eliminates the need to rely on fit-parameters and phenomenological laws (like the ABC-law for carrier losses) that used to put large error margins right at the start of device simulations. Instead, SimuLase’s fully microscopic models allow to predict quantitatively correct the fundamental characteristics like absorption/gain- and PL-spectra or the carrier losses due to radiative and Auger processes.

Version 3.0 includes a range of new features including, New Material Systems, Interfaces to VASP DFT, interactive 3D Plotting of datasets

The highly accurate, predictive and fit-parameter free nature of the approach allows for a fundamentally improved approach to design, analyze and optimize devices with:

•	a simple, fast and quantitatively predictive design of new devices,
•	a strong reduction of required design/growth/re-design iterations,
•	an unprecedented insight in the characteristics of new or existing devices,
•	a precise quality control using non-destructive testing.

 

• easy-to-use GUI to set up heterostructures, check level positions, mode confinement, reflection,… • edge-emitters, top-emitters, lasers, LEDs, V(E)CSELs, electroabsorption modulators, sensors/absorbers – if it is based on a heterostructure SimuLase™ is the modeling tool for it, • various material choices (AlGaAs, InGaAsP, GaInNAs, etc.), • variable structure design (SQW, MQW, SL, GRINSCH, …), • multi-processor and GPU option included, • includes SimuLase_Designer™ for easy set-up and variation of the structure design, • educational version available at reduced price.