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SimuLase™ is the first software tool that allows
a broad audience to take full advantage of the latest in semiconductor modelling. It's
underlying fully microscopic many-body models allow to determine/predict the essential electro-optical
properties like gain/absorption, refractive indicies, spontaneous emission (photo luminescence)
or carrier losses due to radiative and Auger losses, with unprecedented accuracy while removing
fit-parameters that used to require time and cost-intensive experimental investigations.
Tools based on the microscopically calculated
properties also allow to calculate macroscopic properties like transverse and longitudinal optical
modes, reflectivity and transmission spectra, surface-PL spectra that
take into account cavity effects that modify the pure material PL, threshold currents
or operating characteristics for V(E)CSEL structures. SimuLase also
allows for easy comparisons between experimental and theoretical results.
The ground breaking quality of the underlying mircoscopic many-body models
has been demonstrated in dozens of articles in peer-reviewed journals (see our
publications section).
You can download a real-life description of how
SimuLase can be used to design, analyze and optimize e.g. edge-emitting devices and VECSELs
here.
SimuLase™ provides:
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the correct fundamental input that is the required starting point for any
reliable device modeling. The data can be easily imported in other commercial software tools for further
investigations.
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an easy to use GUI-interface that allows to determine many basic characteristics
of structures without any experimental feedback,
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experimentally veryfied models that have lead to more than
fifty publications in peer-reviewed journals over the last two decades.
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And, you don't have to be an expert in microscopic manybody physics to take full advantage of this tool.
SimuLase™ can preset all parameters besides the structural design automatically -
taking full advantage of the fit-parameter free nature of the microscopic models.
For quick shots or research interests, SimuLase allows to influence the calculation parameters or use simplified models.
SimuLase™ allows to:
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set up GainDatabases yourself without having to disclose any information and
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analyze the data with the integrated
SimuLase_Analyzer™,
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design, analyze and optimize devices with unprecedented accuracy and ease.
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You can download a free demo-version of SimuLase™ as
well as its manual or a quick start guide
here.
SimuLase™ is readily available for the following material-families:
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AlInGaAsP,
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includes: GaAs, AlAs, InAs, GaP, AlP, InP, AlxGa1-xAs, InxGa1-xAs,
InxAl1-xAs,
AlxGayIn1-x-yAs, InxGa1-xP, GaAsxP1-x,
InAsxP1-x, AlxGa1-xP,
InxGa1-xAsyP1-y,
AlxGa1-xAsyP1-y, In1-x(AlyGa1-y)xP
(x, y between 0.0 and 1.0).
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AlInGaNAs,
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(dillute Nitride) includes: GaAs, AlAs, InAs, AlxGa1-xAs, InxGa1-xAs,
InxAl1-xAs,
AlxGayIn1-x-yAs,
GaNzAs1-z,
InxGa1-xNzAs1-z
(x, y between 0.0 and 1.0, z between 0.0 and 0.2).
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Coming soon:
All versions include metallization layers (currently Ti, Cr and Au) and dielectric coatings
(currently Si3N4, Al2O3, SiO2, Ta2O5,
TiO2, and Y2O3).
Other metals and coatings will be included (at no extra cost) upon request.
You can order SimuLase™
for semiconductor materials outside the mentioned families or customized mixtures.
Tools that are included in the full SimuLase™ package are:
For any questions regarding SimuLase™, including pricing, please contact us at
simulase@nlcstr.com.
Screen-grabs of SimuLase™. Click for enlarged image.
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